ISO 13320-1 PDF

ISO INTERNATIONAL. STANDARD. ISO. First edition .. Since the publication of ISO , the understanding of light. ISO (E). INTERNATIONAL. STANDARD. ISO. First edition . Particle size analysis — Laser diffraction methods —. Part 1. Scope. This part of ISO provides guidance on the measurement of size distributions of particles in any two-phase system, for example powders, sprays.

Author: Meztinos Gutilar
Country: Turks & Caicos Islands
Language: English (Spanish)
Genre: Career
Published (Last): 10 January 2009
Pages: 88
PDF File Size: 10.94 Mb
ePub File Size: 15.19 Mb
ISBN: 942-8-90514-308-6
Downloads: 26656
Price: Free* [*Free Regsitration Required]
Uploader: Tejind

Specification NanoTec Measuring range, overall and during each analysis 0.

Add a tag Cancel Be the first to add a tag for this edition. Subcommittee SC 4, Sizing by methods other than sieving. Part 1, General principles. Skip to content Skip to search. This single location in All: Tags What are tags? Found at these bookshops Searching – please wait View online Borrow Buy Freely available Show 0 more links All laser diffraction instruments for particle size measurement can be compared worldwide based on this table.

It does not address the specific requirements of particle size measurement of specific products. Lists What are lists? Particle size analysis — laser diffraction methods. The resulting particle size distribution may be different from those obtained by methods based on other physical principles e.

You also may like to try some of these bookshopswhich may or may not sell this item.


This single location in Victoria: None of your libraries hold this item. Separate different tags with a comma.

The international standard ISO “Particle Size Analysis — Laser Diffraction Methods” describes the methods for the determination of particle size distribution via laser diffraction. This part of Is is applicable to particle sizes ranging from approximately 0,1 um to 3mm.

Laser Particle Sizer ANALYSETTE 22 NanoTec Measuring Unit – ISO –

Specification NanoTec Typical measuring time 10 s Minimum 13320–1 between measurements 2 min. Industriestrasse 8 Idar-Oberstein. ISO consists of the following parts, under the general title ‘Particle size analysis — laser diffraction methods’: Laser beams — Diffraction — Standards. Check copyright status Cite this Title Particle size analysis — laser diffraction methods. Login to add to list.

BS ISO 13320-1:1999

These online bookshops told us they have this item: Types of output, e. Comments and reviews What are comments? Be the first to add this to a list. Part 1, General principles ; Part 2, Validation of inversion procedures”–Foreword, p.

Specification NanoTec Lso of model matrix yes Multiple scattering calculation yes, internal Type of optical models that can be applied Mie, Fraunhofer Indicative description of mathematical methods for example weighting, bounding, grading Regularization.

We were unable to find this edition in any bookshop we are able to search.

BS ISO – Particle size analysis. Laser diffraction methods. General principles

Then set up a personal list of libraries from your profile page by clicking on your user name at the top right of any screen. To include a comma in your tag, surround the tag with double quotes. Specification NanoTec Depth of the measuring plane in laser beam 4 mm Liquid pump rate 6. Set up My libraries How do I set up “My libraries”? Lower detection limit for small amounts of small and large particles in size distributions with measuring range.


In order to set up a list of libraries that you have access to, you must first login or sign up. Public Private login e.

Table of the technical specifications demanded according to ISO Open to the public ; For non-spherical particles, and equivalent-sphere size distribtution is obtained because the technique uses the assumption of spherical particles in its optical model. Specification NanoTec Number of elements 51 Geometry e. Physical Description v, io p. Segments Alignment automatic oder manual automatic and manual Detector elements calibrated yes Lower detection limit for small amounts and of small and large particles yes Overload level for detector elements 12Bit, Indicative description of mathematical methods for example weighting, bounding, grading.

Home This edition, English, Book, Illustrated edition: